Part two explains the workings of the JTAG (IEEE 1149.1) boundary-scan technology. In software development, perhaps the most critical, yet least predictable stage in the process is debugging. Many ...

Imagine a world without a global notion of time. Now try to find out the flight direction of an airplane with the following information: There's an e-mail from Alice that she saw the plane about two ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Debug consumes more time than any other aspect of the chip design and verification process, and it adds uncertainty and risk to semiconductor development because there are always lingering questions ...

Part four explains how to use breakpoints, event triggers, and program traces to debug code. Part six reviews the common bugs found in DSP applications, and outlines the different testing methods ...